research article
oaioai:bib-pubdb1.desy.de:331673

Structure of reactively sputter deposited tin-nitride thin films: A combined X-ray photoelectron spectroscopy, in situ X-ray reflectivity and X-ray absorption spectroscopy study

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Publication date
1 January 2005
Publisher
'Elsevier BV'
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    Last time updated on 12/10/2017

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