Detection of transmutational elements in copper by means of total reflection X-ray fluorescence spectrometry using synchrotron radiation

Abstract

High-purity copper samples were irradiated with high-energy protons and neutrons. The concentration of transmutational elements was measured by means of the total reflection x-ray fluorescence method using synchrotron radiation. The spectra of non-irradiated samples were substracted from the spectra of the irradiated samples. By this evaluation method, the minimum detectable concentration was as low as 1.5 μg g−1 in a copper matrix