Field Programmable Gate Array Reliability Analysis Using the Dynamic Flowgraph Methodology

Abstract

AbstractField programmable gate array (FPGA)-based systems are thought to be a practical option to replace certain obsolete instrumentation and control systems in nuclear power plants. An FPGA is a type of integrated circuit, which is programmed after being manufactured. FPGAs have some advantages over other electronic technologies, such as analog circuits, microprocessors, and Programmable Logic Controllers (PLCs), for nuclear instrumentation and control, and safety system applications. However, safety-related issues for FPGA-based systems remain to be verified. Owing to this, modeling FPGA-based systems for safety assessment has now become an important point of research. One potential methodology is the dynamic flowgraph methodology (DFM). It has been used for modeling software/hardware interactions in modern control systems. In this paper, FPGA logic was analyzed using DFM. Four aspects of FPGAs are investigated: the “IEEE 1164 standard,” registers (D flip-flops), configurable logic blocks, and an FPGA-based signal compensator. The ModelSim simulations confirmed that DFM was able to accurately model those four FPGA properties, proving that DFM has the potential to be used in the modeling of FPGA-based systems. Furthermore, advantages of DFM over traditional reliability analysis methods and FPGA simulators are presented, along with a discussion of potential issues with using DFM for FPGA-based system modeling