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oaioai:repository.upenn.edu:be_papers-1119

Strong Tip Effects in Near-field Scanning Optical Tomography

Authors
Publication date
15 November 2007
Publisher
ScholarlyCommons
Doi

    Abstract

    A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations

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    This paper was published in ScholarlyCommons@Penn.

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