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Research Efficiency in Manufacturing: An Application of DEA at the Industry Level

By Jens Schmidt-Ehmcke and Petra Zloczysti

Abstract

This paper analyzes research efficiency at the industry level in manufacturing for 13 European member and four nonmember countries during 2000 and 2004. A unique dataset was compiled that matches patent applications at the European Patent Office (EPO) to industry-specific R&D inputs from EU KLEMS. We find that Germany, the United States, and Denmark have the highest efficiency scores on average in total manufacturing. The main industries that are at the technology frontier are those involved in electrical and optical equipment and machinery. Separate frontier estimations for these industries, conducted without the constraint of a constant technology frontier, provide additional support for our results.R&D efficiency, industry level, data envelopment analysis, manufacturing

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  1. (2000). A general methodology for bootstrapping in nonparametric frontier models,
  2. (1993). A procedure for ranking efficient units in data nvelopment analysis,
  3. (2005). An international comparison of R&D efficiency:
  4. (1997). Data analysis as a tool for constructing scientom indicators,
  5. (2007). Estimation and inferences in two-stage, semi-parametric models of production process,
  6. (1984). etric entometrics, 40:45–46. ented ial Sectors, Final report to the European Commission, ISI, Karlsruhe. cientometrics, 76:483–501. nding business patenting and censing: Results of a survey.
  7. (2008). EU LEMS—Linked Data: Sources and Methods, University of Birmingham, Birmingham. options: Some estimates of the value of holding european patent tocks,
  8. (1965). Firm size, market structure, opportunity, and the output of pat inventions,
  9. (2008). Inter-country R&D efficiency analysis: An application of data envelopment analysis,
  10. (2003). Linking Technology Areas to Industr SCHNEIDER,
  11. (2001). ls for count data with n application to the patents—R&D relationship,
  12. (1978). Measuring the inefficiency of decision making units,
  13. (2002). Non-parametric tests of returns to scale,
  14. (1990). Patent statistics as economic indicators: a survey,
  15. (1984). Patents and R and D at the firm level: A first look. In:
  16. (1986). Patents and R&D: Is there a lag? International Economic Review,
  17. (2007). Per un pugno di dollari: A first loo GRILICHES,
  18. pportunity and spillovers of R&D: Evidence from firms’ atents, profits, and market value,
  19. (2000). Protecting their Intellectual Assets: Appropriability Conditions and Why US Manufacturing Firms Patent (or Not), NBER Working Paper,
  20. (2007). R&D efficiency and economic pe u
  21. (2007). Relative efficiency of R&D activities: A cro a
  22. (1997). Research, patenting, and technological change,
  23. (1998). Sensitivity analysis of efficiency scores: How to bootstrap in nonparametric frontier models,
  24. (1984). Some models for estimating technical nd scale inefficiencies in data envelopment analysis,
  25. (2008). The EU KLEMS Growth and Productivity M., oductivity Accounts, Version 1.0, Part I ethodology,
  26. (2001). The patent paradox revisited: An empirical study of patenting in the U.S. semiconductor industry, 1979–1995,
  27. (2006). The super-efficiency procedure for outlier identification,

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