Current trends in technology are leading to a need for ever smaller and more complex featured surfaces. The techniques for manufacturing these surfaces are varied but are tied together by one limitation; the lack of useable, on-line metrology\ud instrumentation. Current metrology methods require the removal of a workpiece for characterisation which leads to machining down-time, more intensive labour and generally presents a bottle neck for throughput.\ud \ud \ud In order to establish a new method for on-line metrology at the nanoscale investigation are made into the use of optical fibre interferometry to realise a compact probe that is robust to environmental disturbance. Wavelength tuning is combined with a dispersive element to provide a moveable optical stylus that sweeps the surface. The phase variation caused by the surface topography is then analysed using phase shifting interferometry.\ud \ud \ud A second interferometer is wavelength multiplexed into the optical circuit in order to track the inherent instability of the optical fibre. This is then countered using a closed loop control to servo the path lengths mechanically which additionally counters external vibration on the measurand. The overall stability is found to be limited by polarisation state evolution however.\ud \ud \ud A second method is then investigated and a rapid phase shifting technique is employed in conjunction with an electro-optic phase modulator to overcome the polarisation state evolution. Closed loop servo control is realised with no mechanical movement and a step height artefact is measured. The measurement result shows good correlation with a measurement taken with a commercial white light interferometer
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