IEEE Transactions on Instrumentation and Measurement

Almeida, Luiz Alberto Luz de; Deep, Gurdip Singh; Lima, Antonio Marcus Nogueira; Neff, Helmut Franz; Freire, Raimundo Carlos Silvério

oai:agregador.ibict.br.RI_UFBA:oai:192.168.11:11:ri/7682

IEEE Transactions on Instrumentation and Measurement

Authors: Luiz Alberto Luz de Almeida
Gurdip Singh Deep
Antonio Marcus Nogueira Lima
Helmut Franz Neff
Raimundo Carlos Silvério Freire
Publication date: 1 January 2012
Publisher

Abstract

Texto completo: acesso restrito. p. 1030-1035This paper presents the adaptation of the Preisach model, originally developed for magnetic hysteresis, to describe mathematically the hysteresis in the resistance-temperature characteristics of vanadium–dioxide VO2 thin film radiation sensors. The necessary and sufficient conditions for the applicability of the Preisach model to a (VO2) film sensor are experimentally verified. Experimentally measured characteristics are compared with those given by the model for minor and major loops

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