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Characterization of Si-SiO2 interfaces by XPS and photo-current measurements

By Anna Paola Caricato


Dottorato di ricerca in fisica. 12. ciclo. Tutori Sergio Valeri e Maria Luisa PolignanoConsiglio Nazionale delle Ricerche - Biblioteca Centrale - P.le Aldo Moro, 7, Rome; Biblioteca Nazionale Centrale - Cavalleggeri, 1, Florence / CNR - Consiglio Nazionale delle RichercheSIGLEITItal

Topics: 20A - Theoretical physics
Year: 2000
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Provided by: OpenGrey Repository
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