Total reflection X-ray spectrometry: Method and applications

Prange, A. (GKSS-Forschungszentrum Geesthacht G.m.b.H., Geesthacht-Tesperhude (Germany). Inst. fuer Physik); GKSS-Forschungszentrum Geesthacht G.m.b.H., Geesthacht-Tesperhude (Germany)

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Total reflection X-ray spectrometry: Method and applications

Authors: A. (GKSS-Forschungszentrum Geesthacht G.m.b.H., Geesthacht-Tesperhude (Germany). Inst. fuer Physik) Prange
Geesthacht-Tesperhude (Germany) GKSS-Forschungszentrum Geesthacht G.m.b.H.
Publication date: 1 January 1989
Publisher
Doi

Abstract

SIGLESpecial print from Spectrochim. Acta, Part B (1989) v. 44(5) p. 437-452 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekDEGerman

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