Skip to main content
Article thumbnail
Location of Repository

An intensity-monitoring technique for measuring ellipsometric transients

By J.M.M. Droog and G.A. Bootsma

Abstract

Intensity-monitoring techniques make possible the measurement of rapid changes in the ellipsometric parameters. Methods used hitherto have been suitable for measuring slight changes only and require prior knowledge of the Δ and Ψ values for the initial surface. It is shown that larger changes can also be measured and that the values of Δ and Ψ for the initial surface need not be known beforehand. To illustrate the method measurements are made relating to the anodising of a hanging mercury drop electrode in 1 mol dm−3 NaOH; under these conditions a thick oxide layer is known to be formed

Topics: Scheikunde
Year: 1979
OAI identifier: oai:dspace.library.uu.nl:1874/24863
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • http://dspace.library.uu.nl:80... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.