Location of Repository

Intermittency phenomena in electrical connectors

By C. Maul, J.W. McBride and J. Swingler

Abstract

Fretting is known to be a major cause of contact deterioration and failure, particularly in tin-plated contacts. During fretting the contact resistance generally increases slowly with time. Superimposed on this slow increase in contact resistance are rapid changes in contact resistance within fractions of a second, called intermittences or short duration discontinuities. Although intermittences have been reported by several authors, they are frequently overlooked in traditional fretting experiments and not much is known about their origin. The present study aims at filling this gap. A test apparatus has been built to measure the contact voltage-drop profile during an intermittence and fretting experiments on tin-plated copper contacts have been carried out. The results lead to a set of requirements for a model to explain intermittency phenomena

Topics: TK, TA
Year: 2001
OAI identifier: oai:eprints.soton.ac.uk:21697
Provided by: e-Prints Soton

Suggested articles

Preview

Citations

  1. (1999). A new test equipment for high dynamic real-time measuring of contact resistances,” in
  2. (2000). A preliminary study on an optimal application level for a polyphenyl ether on fretted tin/lead surfaces,” in
  3. (1981). Dynamic contact resistance of gold, tin and palladium connector interfaces during low amplitude motion,” in
  4. (2000). Electric Contacts:
  5. (1999). Electrical Contacts, 1st ed.
  6. (1986). Fretting corrosion of tin-plated copper alloy,” in
  7. (1988). Fretting in aluminum-to-copper connections,” in
  8. (2000). Instrumentation system for the detection of intermittency phenomena in electrical connectors,”
  9. (1997). Intermittence detection in fretting corrosionstudies ofelectricalcontacts,”in
  10. (1975). Intermittent opens in electrical contacts caused by mechanically induced contact motion,”
  11. (2000). J.Swingler,J.W.McBride,andC.Maul,“Thedegradationofroadtested automotive connectors,”
  12. (2000). Measuring intermittences in electrical contacts,” in
  13. (2000). on the length and severity of intermittences in electricalcontacts,” in
  14. (2000). On the nature of intermittences in electrical contacts,” in
  15. (2000). Possible mechanism for observed dynamic resistance,” in
  16. (1997). Recovery of severely degraded tin–lead plated connector contacts due to fretting corrosion,” in
  17. (2000). Short arc duration laws and distributions at low
  18. (1984). Time distribution of intermittents versus contact resistance for tin–tin connector interfaces during low amplitude motion,”

To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.