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NEW MEASURES OF THE QUALITY AND OF THE RELIABILITY OF FITS APPLIED TO FORWARD HADRONIC DATA AT T = 0

By J.R. CUDELL, K. KANG, V.V. EZHELA, YU.V. KUYANOV, S.B. LUGOVSKY, N.P. TKACHENKO, P. GAURON, B. NICOLESCU and null null
Publisher: WORLD SCIENTIFIC
Year: 2010
DOI identifier: 10.1142/9789812778352_0016
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Provided by: MUCC (Crossref)
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