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Near-wall nanovelocimetry based on total internal reflection fluorescence with continuous tracking

By Zhenzhen Li, Loïc D’eramo, Choongyeop Lee, Fabrice Monti, Marc Yonger, Patrick Tabeling, Benjamin Chollet, Bruno Bresson and Yvette Tran
Publisher: Cambridge University Press (CUP)
Year: 2015
DOI identifier: 10.1017/jfm.2015.12
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Provided by: MUCC (Crossref)
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