Article thumbnail

Atomic force microscopy-induced electric field in ferroelectric thin films

By Biao Wang and C. H. Woo
Publisher: AIP Publishing
Year: 2003
DOI identifier: 10.1063/1.1603345
OAI identifier:
Provided by: MUCC (Crossref)
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • (external link)
  • Suggested articles

    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.