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Polarisation analysing complementary metal-oxide semiconductor image sensor in 65-nm standard CMOS technology

By N. Wakama, D. Okabayashi, T. Noda, K. Sasagawa, T. Tokuda, K. Kakiuchi and J. Ohta
Publisher: Institution of Engineering and Technology (IET)
Year: 2014
DOI identifier: 10.1049/joe.2013.0033
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Provided by: MUCC (Crossref)
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