Article thumbnail

The edge process model and its application to information-hiding capacity analysis

By S. Voloshynovskiy, O. Koval, M.K. Mihcak and T. Pun
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Year: 2006
DOI identifier: 10.1109/tsp.2006.871965
OAI identifier:
Provided by: MUCC (Crossref)
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • https://archive-ouverte.unige.... (external link)
  • Suggested articles

    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.