The edge process model and its application to information-hiding capacity analysis

By S. Voloshynovskiy, O. Koval, M.K. Mihcak and T. Pun

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Year: 2006

DOI identifier: 10.1109/tsp.2006.871965

OAI identifier:

Provided by: MUCC (Crossref)

Download PDF:
_{Sorry, we are unable to provide the full text but you may find it at the
following location(s):}

https://archive-ouverte.unige.... (external link)