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The edge process model and its application to information-hiding capacity analysis

By S. Voloshynovskiy, O. Koval, M.K. Mihcak and T. Pun
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Year: 2006
DOI identifier: 10.1109/tsp.2006.871965
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Provided by: MUCC (Crossref)
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