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Characterization of aluminum oxide tunnel barriers by combining transport measurements and transmission electron microscopy imaging

By T. Aref, A. Averin, S. van Dijken, A. Ferring, M. Koberidze, V. F. Maisi, H. Q. Nguyend, R. M. Nieminen, J. P. Pekola and L. D. Yao
Publisher: AIP Publishing
Year: 2014
DOI identifier: 10.1063/1.4893473
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Provided by: MUCC (Crossref)
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