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CMB polarimetry with BICEP: instrument characterization, calibration, and performance

By Yuki D. Takahashi, Denis Barkats, John O. Battle, Evan M. Bierman, James J. Bock, H. Cynthia Chiang, C. Darren Dowell, Eric F. Hivon, William L. Holzapfel, Viktor V. Hristov, William C. Jones, J. P. Kaufman, Brian G. Keating, John M. Kovac, Chao-Lin Kuo, Andrew E. Lange, Erik M. Leitch, Peter V. Mason, Tomotake Matsumura, Hien T. Nguyen, Nicolas Ponthieu, Graca M. Rocha, Ki Won Yoon, P. Ade and L. Duband
Publisher: SPIE
Year: 2008
DOI identifier: 10.1117/12.790306
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Provided by: MUCC (Crossref)
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