Millimeter-Wave On-Wafer TRL Calibration Employing 3-D EM Simulation-Based Characteristic Impedance Extraction

By Luca Galatro and Marco Spirito

Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'

Year: 2017

DOI identifier: 10.1109/tmtt.2016.2609413

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Provided by: MUCC (Crossref)

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