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Millimeter-Wave On-Wafer TRL Calibration Employing 3-D EM Simulation-Based Characteristic Impedance Extraction

By Luca Galatro and Marco Spirito
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 2017
DOI identifier: 10.1109/tmtt.2016.2609413
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Provided by: MUCC (Crossref)
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