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Author manuscript, published in "International Symposium on Security and Safety of Complex Systems, 2SCS'12, Morocco



Abstract: This paper presents an approach of diagnosis for manufacturing system considered as Discrete Event Systems. It uses plant decomposition and a decentralized diagnosis structure to reduce the combinatory explosion found in centralized structures. The local behavior is extracted using decentralized plant modeling. It is from this behavior that possible faults are identified to construct abnormal behavior models. The approach is illustrated around a manufacturing benchmark

Topics: Discrete Events Systems, Modeling, Diagnosis, Manufacturing systems
Year: 2012
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