This paper addresses the problem of space compaction of test responses of combinational and scan-based sequential circuits. It is shown that given a precomputed test set T , the test responses at the functional outputs of the given circuit-under-test (CUT) can be compacted to a single periodic output, with guaranteed zero-aliasing. The method is independent of the fault model and the structure of the CUT, and uses only the knowledge of the test set T and the corresponding fault-free responses---it is particularly suitable for intellectual property (IP) cores. A new concept of distinguishing outputs and characteristic response function is utilized for synthesizing the compactor. Relevant experimental results on hardware overhead for several ISCAS circuits are presented. 1 Introduction Space compaction, which refers to the problem of reducing a wide data stream to a narrow signature stream, is commonly used for test response compression. Atypical space compaction scheme for a general c..
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