This paper is a continuation of our previous work  on the elaboration of first principles model for computing the BSDF (Bi-directional Scattering Distribution Function) of a cloth. New method realizes the idea of full statistical approach to cloth modeling with probabilistic goniometrical spectrophotometer. The main goal of the paper is to determine (based on original cloth model) parameters of probabilistic distributions used by stochastic ray tracing algorithm for implicit model of a cloth. go down with cloth hierarchy we encounter such deterministic elements as number of fibers in a yarn, fiber cross-section shape, attenuation coefficient of the yarn etc. Most significant statistical elements are fiber distributions along the yarn then we also have roughness of the fiber surface etc. This is the area where cloth analysis is expected to be enhanced by statistical approach
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