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MATERIALS-05 Influence of ion-charge state on damage morphology of ion tracks in dark mica

By M. Lang, W. Hasenkamp, N. Ishikawa, N. Medvedev, R. Neumann, R. Papaléo, C. Trautmann, K. -o. Voss and T. Yamaki


In many dielectrics, swift heavy ions of MeV-GeV energy produce tracks of a few nm in diameter. The track morphology depends on energy loss (dE/dx), particularly the formation of a continuous damage trail requires a critical (dE/dx)c. Below this threshold, chemical etching of discontinuous tracks exhibits inhomogeneous pore sizes and the track etching efficiency drops below unity. In the recent past, we studied the influence of dE/dx and of the ion velocity on the track morphology at fixed dE/dx [1,2]. Here, we report how the ion charge state affects the track morphology. The experiments were performed with phlogopite, a dark mica mineral for which fission-track etching is frequently applied for dating of geological samples. and JAEA Takasaki) using energies from 120 to 650 MeV

Year: 2010
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