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Stochastically Estimating Modular Criticality in Large-Scale Logic Circuits Using Sparsity Regularization and Compressive Sensing

By Mohammed Alawad, Ronald DeMara and Mingjie Lin
Publisher: 'MDPI AG'
Year: 2015
DOI identifier: 10.3390/jlpea5010003
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Provided by: MUCC (Crossref)
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