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Deeper Depth Prediction with Fully Convolutional Residual Networks

By Iro Laina, Christian Rupprecht, Vasileios Belagiannis, Federico Tombari and Nassir Navab
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 2016
DOI identifier: 10.1109/3dv.2016.32
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Provided by: MUCC (Crossref)
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