Deeper Depth Prediction with Fully Convolutional Residual Networks

By Iro Laina, Christian Rupprecht, Vasileios Belagiannis, Federico Tombari and Nassir Navab

Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'

Year: 2016

DOI identifier: 10.1109/3dv.2016.32

OAI identifier:

Provided by: MUCC (Crossref)

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