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Single-trial event-related potentials with wavelet denoising: method and applications

By R. Quian Quiroga

Abstract

We describe a method based on the wavelet transform for denoising single-trial event-related potentials (ERPs). The identification of the event-related responses in the single-trials allows the study of latency jitters and cognitive processes, such as habituation, sensitization and learning. Since the method is fast and parameter free, it could complement ERP conventional analysis

Year: 2005
DOI identifier: 10.1016/j.ics.2004.11.062
OAI identifier: oai:lra.le.ac.uk:2381/3751
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