Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

Petrik, Peter; Milita, Silvia; Pucker, Georg; Nassiopoulou, Androula G.; Van den Berg, Jakob; Reading, Michael A.; Fried, Miklos; Lohner, Tivadar; Theodoropoulou, M; Gardelis, Spyros; Barozzi, Mario; Ghulinyan, Mher; Lui, Alberto; Vanzetti, Lia; Picciotto, Antonio

oai:eprints.hud.ac.uk:12255

Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction

Authors: Peter Petrik
Silvia Milita
Georg Pucker
Androula G. Nassiopoulou
Jakob Van den Berg
Michael A. Reading
Miklos Fried
Tivadar Lohner
M Theodoropoulou
Spyros Gardelis
Mario Barozzi
Mher Ghulinyan
Alberto Lui
Lia Vanzetti
Antonio Picciotto
Publication date: 1 October 2009
Publisher: Electrochemical Society
Doi

Abstract

Nanocrystalline semiconductors embedded in dielectric matrices are currently under investigation for use in Si-photonics and in memory devices. The aim of a joint research activity in the FP6-ANNA*) project (http://www.i3-anna.org) is to develop and improve metrologies for the measurement of nanocrystal properties

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oai:eprints.hud.ac.uk:12255

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