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The flat iron device for measuring changes in conductivity

By McKee S and Cuminato J

Abstract

This note proposes an alternative to both the "transient hot-wire method" and the "transient hot-strip method". A mathematical model is developed and an analytic solution is provided. The "flat iron device" may have advantages for rapidly measuring changes in conductivity, as can occur in food products

Topics: Materials
Year: 1994
OAI identifier: oai:generic.eprints.org:315/core70

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Citations

  1. (1984). Circuit design for transient measurements of electrical properties of thin metal films and thermal properties of insulating solids or liquids. doi
  2. (1964). Handbook of Mathematical Functions. doi
  3. (1971). t Temperature as a function of time 271 i
  4. (1991). Transient plane source techniques for thermal conductivity and thermal diffusivity measurements of solid materials. doi

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