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An improved model-based method to test circuit faults

By Xiaochun Cheng, Dantong Ouyang, Jiang Yunfei and Chengqi Zhang

Abstract

This paper presents an improved model-based reasoning method to test circuit faults. The proposed automated testing procedure is applicable even when the target system contains multiple faulty modes. Based on the proposed method, the observation can be organised to guarantee correct solutions are included in the restricted candidate space. The existent consistency-checking method and abductive reasoning method are special cases of the proposed method. The relationship between the testing procedure and the corresponding prime implication is formally analyzed for algorithmic implementation. The work is being extended, funded by the Chinese National Natural Science Foundation, in collaboration with Jilin University, China

Publisher: Elsevier, B. V.
Year: 2005
OAI identifier: oai:eprints.mdx.ac.uk:40
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