oaioai:ira.lib.polyu.edu.hk:10397/66655

Effect of improved contact on reliability of sub-60 nm carbon nanotube vias

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Publication date
1 January 2016
Publisher
'IOP Publishing'
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    Department of Applied Physic

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    Last time updated on 10/02/2018

    This paper was published in The Hong Kong Polytechnic University Pao Yue-kong Library.

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