We consider numerically the depinning transition in the random-field Ising
model. Our analysis reveals that the three and four dimensional model displays
a simple scaling behavior whereas the five dimensional scaling behavior is
affected by logarithmic corrections. This suggests that d=5 is the upper
critical dimension of the depinning transition in the random-field Ising model.
Furthermore, we investigate the so-called creep regime (small driving fields
and temperatures) where the interface velocity is given by an Arrhenius law.Comment: some misprints correcte