We study Probabilistic Group Testing of a set of N items each of which is
defective with probability p. We focus on the double limit of small defect
probability, p>1, taking either p->0
after N→∞ or p=1/Nβ with β∈(0,1/2). In both settings
the optimal number of tests which are required to identify with certainty the
defectives via a two-stage procedure, Tˉ(N,p), is known to scale as
Np∣logp∣. Here we determine the sharp asymptotic value of Tˉ(N,p)/(Np∣logp∣) and construct a class of two-stage algorithms over which
this optimal value is attained. This is done by choosing a proper bipartite
regular graph (of tests and variable nodes) for the first stage of the
detection. Furthermore we prove that this optimal value is also attained on
average over a random bipartite graph where all variables have the same degree,
while the tests have Poisson-distributed degrees. Finally, we improve the
existing upper and lower bound for the optimal number of tests in the case
p=1/Nβ with β∈[1/2,1).Comment: 12 page