Study of the microstructure and stress induced during the crystallization of GeTe thin films

Authors
Publication date
1 September 2017
Publisher
HAL CCSD

Abstract

International audienc

    Similar works

    Full text

    thumbnail-image

    Available Versions

    HAL AMU

    redirect
    oaioai:HAL:hal-01781812v1
    Last time updated on 14/05/2018

    Archive Ouverte en Sciences de l'Information et de la Communication

    redirect
    oaioai:HAL:hal-01781812v1
    Last time updated on 09/05/2018