Colloidal quantum-dot light-emitting
diodes (QLEDs) are lucrative
options for color-pure lighting sources. To achieve high-performance
QLEDs, besides developing high-efficiency quantum dots (QDs), it is
essential to understand their device physics. However, little understanding
of the QD emission behavior in active QLEDs is one of the main factors
hindering the improvement of device efficiency. In this work, we systematically
studied the exciton dynamics of gradient composition CdSe@ZnS QDs
during electroluminescence in a working QLED. With time-resolved photoluminescence
analyses using fluorescence lifetime imaging microscopy we analyzed
a large population of QDs spatially spreading over an extended area
inside and outside the device. This allows us to reveal the statistically
significant changes in the behavior of QD emission in the device at
different levels of applied voltages and injection currents. We find
that the QD emission efficiency first drops in device fabrication
with Al electrode deposition and that the QD exciton lifetime is then
statistically reduced further under the QLED’s working conditions.
This implies the nonradiative Auger recombination process is active
in charged QDs as a result of imbalanced charge injection in a working
QLED. Our results help to understand the exciton behavior during the
operation of a QLED and demonstrate a new approach to explore the
exciton dynamics statistically with a large QD population