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research
Bubble-domain circuit wafer evaluation coil set
Authors
T. T. Chen
J. L. Williams
Publication date
1 September 1975
Publisher
Abstract
Coil structures have been designed to permit nondestructive testing of bubble wafers. Wafers can be electrically or optically inspected and operated from quasi-static frequency to maximum device operating frequency
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oai:casi.ntrs.nasa.gov:1975000...
Last time updated on 31/05/2013