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Trap analysis from Hysteresis Characteristics of 3D-NAND Flash Memory
Authors
DONGHYUN GO
JAESEOK JIN
+3 more
JEONG SOO LEE
JOUNG HUN PARK
GIL SANG YOON
Publication date
1 January 2021
Publisher
한국반도체학술대회
Abstract
2
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포항공과대학교
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Last time updated on 24/06/2021