Beam-Based Tests Of Intercepting Transverse Profile Diagnostics For FAIR

Abstract

FAIR will serve as a versatile accelerator for ions ofenergies between 200 MeV/u and 29 GeV/u (FAIR startversion) with an intensity variation from some 103 to1013 ppp. In the transport lines the transverse profiledetermination will be mainly based on interceptingmethods: Scintillation screens, SEM-Grids and gas filledMWPCs. These devices are tested at the existing GSISIS18where ions are extracted either in fast mode within 1 μs or slow mode within 0.3 s. The imagingproperties of scintillation screens were investigated. Overintensities 107 to 109 ppp the light output for the screens islinear with respect to the ion intensity. Wire-basedmethods using SEM-Grids and MWPCs are discussed