Electrical characterization of ultra-thin SOI films : comparison of the pseudo–MOSFET and Hg–FET techniques

Authors
Publication date
1 January 2005
Publisher
HAL CCSD

Abstract

International audienc

    Similar works

    Full text

    thumbnail-image

    Available Versions

    Hal - Université Grenoble Alpes

    redirect
    oaioai:HAL:hal-00146289v1
    Last time updated on 11/11/2016