The electrical resistance of single VO2 nanobeams was measured while simultaneously mapping the domain structure with Raman spectroscopy to investigate the relationship between structural domain formation and the metal−insulator transition. With increasing temperature, the nanobeams transformed from the insulating monoclinic M1 phase to a mixture of the Mott-insulating M2 and metallic rutile phases. Domain fractions were used to extract the temperature dependent resistivity of the M2 phase, which showed an activated behavior consistent with the expected Mott−Hubbard gap. Metallic monoclinic phases were also produced by direct injection of charge into devices, decoupling the Mott metal−insulator transition from the monoclinic to rutile structural phase transition