SEM image of 5 µm and 3 µm magnetic particles on a silicon surface (top, right and left) and VSM graphs (bottom, left and right) of 40, 70, 100, and 200 nm thick magnetic particles on silicon surface.

Abstract

<p>The 5 and 3 micron particles were printed using nickel mesh masks with 5 and 3-micron openings. Particle size standard deviation was approximately 7% of the mean based on ImageJ analysis. The evaporation of various thicknesses of magnetic layers creates the difference in the coercive field of the particles. The coercivity of the particles increases with increasing magnetic layer thickness. The VSM measurements were taken with the easy axis of the particles’ magnetization oriented along the direction of the applied magnetic field.</p