Method of samples preparation intended for research of deep centers in i-, n-, and p-layers of GaAs p<sup>+</sup>-pin-n<sup>+</sup> structures and result of analysis

Authors
Publication date
1 October 2016
Publisher
IEEE
Doi

    Abstract

    Abstract is not available.

      Similar works

      Full text

      thumbnail-image

      Available Versions

      Crossref

      redirect
      oaiinfo:doi/10.1109%2Fbec.2016.77...
      Last time updated on 04/08/2021