JAN transistor and diode characterization test program, JANTX diode 1N649-1

Abstract

The data processing and calculation of statistical parameters was performed by the Tektronix computer system. The data acquired for easy vendor to vendor and date code to date code analysis are summarized. Each parameter is presented with test conditions, mean, standard deviation, lowest reading, 10% point (where 10% of all readings are equal to or less than the indicated reading), 90% point (where 90% of all readings are equal to or less than the indicated reading) and the highest reading