The necessary data to create a new class of specifications was the objective of this characterization program. Sample selection was made according to the following criteria: (1) manufacturer or qualified distributor; (2) two vendors; and (3) two date codes. The general guidelines for procurement were two QPL vendors, JAN or JANTX, and two manufacturing lots, 27 from each lot. All data were acquired with three digit accuracy. The data processing and calculation of statistical parameters were performed by the Tektronix computer system using 4 digit display

Takeda, H.

English

NASA Technical Reports Server

AS1-CR-150670) 3AX IRANSISTOE AD DIODE	 N18-222'i7
CHARACTE1IZATICN TEST 1bCGA: JflTX DICCE
1W7591 Final Reçort (CC! Reliability Lab.,
Sunnyvale, Calif.) iLl F BC 102/NF 401	 Tinclas
CSCL 09A G3/33 15650
JAN TRANSISTOR AND DIODE
CHAR	 RIZATION TEST PROGRAM
FINAL REPORT
FOR
JANTX DIODE
1N 759A
MARCH 1977
Prepared
for
GEORGE C. MARSHALL SPACE PLIGHT CENTER
NATIONAL AERONAUTIC:; AND SPACE ADMINISTRATION
Pb,haII Space Flight Center, Alabama 35812
MSFCJNASA CONTRACT No. NAS8 .31944	 O.
pt
V	
'4•HIRO TA1EDA
OCA RELIABILITY LABORATORY
SEC;AL P,- 0-DUCTS DlvsSIO\
975 9ENiCA AVE
SJ.\Y'. ALE. CAL!IA 94036
-
AS
N
REUAUTY LAso*rev
-	 --
https://ntrs.nasa.gov/search.jsp?R=19780014354 2020-03-22T04:52:52+00:00Z
JAN TRANSISTOR AND DIODE
CHARACTERIZATION TEST PROGRAM
FINAL REPORT
FOR
JANTX DIODE
1N759A
MARCH 1977
Prepared
for
GEORGE C. MARSHALL SPACE FLIGHT CENTER
NATIONAL AERONAUTICS AND SPACE ADMINISTRATION
Phrh.uI Space Flight Center, Alabama 35812
MSFCINASA CONTRACT No. NAS8-31944
by
HIRO TAKEDA
OCA RELIABILITY LABORATORY
S°ECIAL PRODUCTS DlVISIO
975 BE\CA AvE
SU?.\Y'. ALE, CALIORNlA 94C36
OCA RELIABILITY LABORATORY
FORWARD
This report is a statistical summary of the electrical
characterization performed on NASA Contract NA8-31944.
This is one of a group of thirty-nine (39) such reports
prepared on selected JAN and JANTX Transistors and Diodes
for the George C. Marshall Space Flight Center, Huntsville,
Alabama. The Contracting Officer's Technical Representative
was Mr. Howard B. Meeks.
This work was performed by DCA Reliability Laboratory,
Special Products Division, Sunnyvale, California under the
management of Mr. Robert Starr with the special assistance
Of Mr. Barry Lorenzo, Nr. Kenneth Radford and Mr. Hiroharu
Takeda.
ORIGINAL pAGe
OF POOR QUAUN
11
CONTENTS
1 60. INTRODUCTION . . . . . -. . . . . . . . . . . . . * . . . 1-1
1.1 Sample Selection . . - . .. .. . . . . . . . . - 1-1
12 Procurement Guidelines . . . . a - . . . . . . . . 1-1
2.0 TEcINIcALSUMMA.RY	 . . a a...... . . . . .21
2.1 TEST PARAMETERS AND CONDITIONS . . ........... 2-a
2.1.1	 Reverse Current (Ii) . . .	 ........ 2-I
2.1.2	 Zener Voltage (V1) ............... 2-i
2.1.4	 Zener Impedance (Zz) . . . . . . . . . . . . . . 2-1
2.1.6 Thermal Resistance, test in DEC/V 	 a . e . 21
2.2 UNIT DEfiNITIONS . . . - . . . 	 ............ 2-2
3.0 STATISTICAL SUMMARY .	 ......
	
3-1
4 .0 HISTOGRAM DATA . . . . - . . . . ... . . . a . . . . . . 4-1
4.1	 . . . . * . . 4-2
4.2	
zi * 	 • • . . . . . .....a . . . . . . . . . 4-7
4.3	 Z2• • • • ...................• 4-14
4.4	 . . . . . . . * . .	 . . . . . * . . . . . . . 4-21
4.5	 ZZ2 * . a • . - . . . a.. • . . a a • . . a a . a • 424
4.6	 . . . . * . . . .
	
. . . - ... - . - . . . . 4-27
iii
CONTENTS (CONTINUED)
5.0 NUMERICAL DATA TA - 25°C
(Book 2 EC 43 & EG 02 MSFC only)	 - . - 5-1
6.0 NUMERICAL DATA TA = +1500C
(Book 2 EC 43 & BC 02 MSFC only) . . . . 6-1
7.0 NUMERICAL DATA TA - -65°C
(Book 2 EC 43 & EG 02 MSFC only) 	 . . - 7-1
iv
LIST OF ILLUSTRATIONS
FIGURE
	2-1	 Internal Construction Siemens . . . . . . . . . . . . . 2-3
	
2-2	 Internal Construction Texas Instruments ........2-3
V
1.0 INTRODUCTION
The objective of this characterization program is to
provide the necessary data to create a new class of
19500 detail specifications "JAN A CLASS".
1.1 SAMPLE SELECTION
Sample selection was made according to the following
criteria:
1. Manufacturer or qualified distributor.
2. Two vendors.
3. Two date codes.
1.2 PROCUREMENT GUIDELINES
The general guidelines for procurement were:
1. Two QPL vendors
2. JAN or JANTX
3. Two (2) manufacturing lots (Date Codes), twenty-
seven (27) from each lot.
1-I
2.0 TECHNICAL SUMMARY
The devices used in this report were JANTX 1N759 Diodes
manufactured by Siemens and Texas Instruments.
All data was acquired with three (3) digit accuracy.
The data processing and calculation of statistical
parameters was performed by the Tektronix S-3260
computer system using four (4) digit display.
2.1 TEST PARAMETERS AND CONDITIONS
	
2.1.1	 I	 V  • 9.6V (80% of Rated V z ) TA = 25°C & 150°C
	
2.1.2	 V ZI	 Iz= 20.OinA	 TA = 25°C, -65°C & 125°C
	
2.1.3	 V2	 I = 35.OmA	 TA	 25°C, -65°C & 125°C
	
2.1.4	 Z1Iz = 20.OmA	 TA	 25°C
	
2.1.5	 Z2	 z = 0.25mA	 TA	 25°C
	
2.1.6	 9J-C	 TA	 100°C
2-1
\
Milli ORIG1	
pAGe is
OF POOR QWILI'
2. 2 UNIT DEFINITIONS
NAME
Kilo
Mull
Micro
Nano
P1cc
SYMBOL
K
H
U
N
P
MULTIPLIER
10
10
10
10 2
Example using a statistical summary section:
IN AAp5	 AT	 25 D.EGMEFS
AT VP : 2.64 VOLTS
!j4)F(I/	 7603	 ?.SIIM
	 21.7U	 !	 2. 01014	 !	 2.090P4 	!	 2.780M	 !
MCI 10/
	 7550!	 2.423M	 276.9t1	 !	 2.(1Iu 14	 2.0 30,4	 !	 ?.780M	 !•
!SR.M/ 7508
	
2.97M	 42b.0 !
	
1.$0M	 2.4901	 3.4bOM !
--------------------------------I ------
Mliii	 Micro
Example using a histogram:
UR5
Ills ,s,sJi1$Il., 1Sl$,.l.1alleg es ll$Hsiisi  1111111 lUll ,uliuIs.".ur.1.1'I	 161PI	 2091
	
5Th	 3JI	 L5t1.37fl	 1.81	 2.33H 281P1	 3.29N
PkQLJT 0
	 \W (:CL	 :Ir:i

3.0 STATISTICAL SUMMARY
The Statistical Summary, pages 3-2 to 3-4, are a
consolidated presentation of the data acquired for-
matted for easy Vendor to Vendor and date code to
date code analysis. Each parameter is presented
with Test Conditions, Mean, Standard Deviation,
Lowest Reading, 10% Point (where 10% of all readings
are equal to or less than the indicated reading),
90% Point (where 90% of all readings are equal to
or less than the indicated reading) and the Highest
Reading.
It should be noted the Mean presented in the summary
may vary slightly from that presented on the Histograms
due to a slight variation in the data base used for
calculation.
EXAMPLE:
SIEMENS:	
'R	 V  = 9.6V	 TA = 25°C
Summary:	 MEAN	 5.713N
Histogram:	 MEAN	 4.717N
OCA RELIABILITY LABORATORY
3-1
IJLP F p:r !AetI.J1v UAKMAIURV
I'AlI' N(1trslW :IN750
VlM0)P : SI f:MF'S	 l)A1R Ct1)I :
	 750
V1Nl(iI4 :IFXAS 1&.
	
OAIE CI)P. :	 750b
•	 see
I	 I	 I	 I	 S	 I	 I
•	 .	 .	 .	 •	 .
!VEND / DC	 IIAN	 ! STO. imrv •	 l,fh PT	 !	 10% Pr	 !	 90% PT	 HIGH t1.
I	 I	 S	 I	 S	 S
• Csa	 sass saaeee.as
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15 D p GREVS
Ar V19.b VIS1.TS
•	 Sans a.	 ________
S1LM/	 7530	 S. 71 3w	 ?h.34	 !	 10 1 0 l )P	 50.00n'	 !	 5 1 08Or	 !	 13b.0t
	
T.i./ 750t,!	 75. 35N	 !	 10.4L	 11.40N	 !	 I Lc.tffi	 !	 144. ON	 !	 79.0I4
I	 S	 I	 I	 I	 I	 I•	 nsa --------- ene
	
I i	 IN 44'.S	 Al	 150 pf.c;E:s
Al VI9.I' V116TS
• ______________________________________5—________________________ 55-----------
	
S I E.M/	 7531)	 9  • lEN	 !	 2 0 6. Si	 I b 1 ON	 24 .('OO	 75.1 01	 I • 346U
	
• I • /	 75'	 1 . 34 ill	 2.1 t4!'	 24M.614	 35',. Oil	 2.1 POIJ	 !	 I '. -101,
I 	 S	 I 	 S	 I 	 I 	 I• ---------------------------------------------------as -----------_____ --------
	
vn	 I  djLUS 41	 75 1(PKS
Al' I V. T = i 4) . 6 ''A
	
I	 I	 I	 I	 I	 I
!SlM/	 75301	 12.31	 1	 1H2.21	 1	 11 • 0 	 1	 11 .1	 1	 12.54	 1
11.1./	 7S01	 12.20	 1	 11 .s4	 It .1	 12.50	 12.66
II	 I	 I	 I	 I	 *•	 as----------
	
7 1	 1 N 'Wi S Al	 -'IS flVG1F F S
AT I?.I:?0.()MA
I	 1	 1	 1	 1	 1
ISIFM/ 75301	 11 .Th	 1414 Q A	Iu.'?	 1 	 11 .4h	 11.49
ORIGINAL PAGE
OCA RELIABILITY LABORATORY	 OF POOR QUAII1Y
3-2
DCA P I.
	 14 L t,1 Ti l.A)i4A I t)k
PAk.I IiIIMh.i. :1N759
• __e	 e.. e aeaaaa.	 aneeeeee aefl•
1
VEil) / DC
	 I	 ML.A1'	 I STD. 0rV.I	 i.nv4 Pi l 	90% PT	 I HIGH PT.
	
S	 S	 I	 I	 I	 I	 I• 50eeeseesefleseseeaeeesasasaaa	 esesS SneflSfleee•
	
vzI	 IN VOLTS Al 125 I)E(;F:Es
AT I'fl0.0 1A
• SsaeeSea	 afleeeena•
I	 I	 I	 I	 I	 I	 I	 I
IS1M/	 1510!	 12.71	 O• 9M	 I	 12.33	 1	 12.39	 1	 13,03	 1	 13.17
I1'. J./	 75O,!	 12.80	 1	 2w). 2 P*	 I	 12.42	 1	 32.4	 I	 13.08
I	 I	 I	 I	 I	 I• - --s_ - ass--------- ee-------Se	 SflasaeesSea .e ee•
	
VZ2	 IN VOLTS AT	 25 IH,PEE:s
AT lzi'=35.t
	
A
• __________e__ s__a_S_S -----------___________e __________ ___------____a___
	 .
I	 I	 I	 I	 I	 I	 I
IS1EM/	 15301	 12.70	 1	 201.4M	 1	 12.22	 12.34	 1	 12.9h	 13.00
11.1.1	 750oI	 12.57	 259.44	 1	 12.01 b 	1	 12.19	 12.83	 33.21I	 I	 I	 I	 I	 I	 I	 I
• SSSSe	 S5a_aSa_a --------_aSeeSCaSeSe•
	
V72	 IN VULU	 Al	 -t5 I'.G1ES
AT 1Y135. 1)	 A
• ease__Sass----- - ----------------------------- -------- ..s.Csss_a-----------
I	 I	 I	 I	 I	 I	 I
IS I EM/	 75 301	 11. SU	 1	 1 h7 •	 I	 II • 1')	 1	 I 1.2	 1	 11 • 71	 11.76
11.1.!	 7bOe,I	 11.43	 2)4.2A
	
11.1)5	 11.10	 1	 11.70	 11.49
I-----------
	
172	 iii Vffl;1S AT	 175 DF.(*.P,ES
AT IZI : 35,() OA
• --------------------------------------as-------------------------------------.
1	 1	 3	 1	 1	 1	 1	 1
!S1 p:M,	 75301	 1.0t	 1	 3.0:	 1	 t?.hl	 12.67	 13.32	 13.36
11.1./	 15061	 13.1?	 1	 265.4	 I	 17.69	 I	 12.)	 1	 13.50	 1	 1
I	 I	 I	 I ----------------------- I	 I	 I
	
7 . I	 IN U's	 A 	 25 1) V C R p i
AT Ii'o.() 14A
1	 1	 1	 1	 1	 1
1S1F.M/	 75301	 4.15'4	 I	 945.0	 I	 I .00	 I	 2.00	 I	 5.400I	 t. 300
11.1./	 /SOt-I	 1.141	 1	 hfl,I)'i	 73',.OX,	 I	 1.770	 1
•	 I	 I	 I	 I	 I	 I
• ------------------------------ ------------------------------------------------
rr'I r'r, lAflIl IV I ApflnArIV
OCA PILJAP1L . ITY L.AI,UPATORY
PART KIJMI4IR :If759
• eeeeeefleeeeeeeee	 e-____aeflep. _
2	 1	 1	 1	 1
!V.fdD , DC	 MEAN	 8109 VEV S I LOA ?T 1 10% Vt 1 90% PT I HIU PT.
•	 _____	 S	 S	 S	 I	 I• eOee __—ee__e_Se e
	
eeseaeOeeeeflSeeee annaea-
	
U,	 iPi QeiPIS	 AT	 25 flI'(diEES
AT IZ :0.25 PIA
• qSfl eeneae_p0e s__s SeeS se eee -
	
ee - -fle. - -
I	 I	 I	 I	 I	 I	 I
151PM! 7530! 40.4U	 Al.to
	 I 5.000	 1	 1.000	 1 7R.00	 2 154.6
IT.!.! lSOe.	 21.56	 I	 4.23	 1	 3.000	 1	 3.000	 1 97.00	 1	 153.0
•	 S	 S	 S	 S	 S	 I
• eeseeeee__-..._ee Sq-----ee 
—e —sessnee -	 _-_q -
U — J —C IN OFLGIW AT 100 DEGREES
(JUNCTION TO CASE)
• see_sen eae.eee - _ne ese 50	 _e eeeq_ -
I	 I	 I	 I	 I	 I	 I
!SIP*! 7530!	 136.5	 1	 6.42	 1	 125.7	 1	 127.5	 2	 145.6	 1	 141.0
IT.!.! 7506!	 143.4	 1	 3.4uu	 1	 133.3	 1	 H4.4	 1	 147.6	 1	 150.3
•	 I	 I	 I	 I	 I	 S
•	 -- -------aeeeee —S
	
___________ ______
ORIGINAL PAGE 13
OF POOR QIJAUTY
OCA RELIABILITY LABORATORY	 3-4


JAN transistor and diode characterization test program: JANTX diode 1N759A

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