WF/PC internal molecular contamination during system thermal-vacuum test

Abstract

During the recent system thermal vacuum test of the Wide-Field/Planetary Camera (WF/PC), instrumentation was added to the WF/PC to characterize the internal molecular contamination and verify the instrument throughput down to 1470 angstroms. Analysis of data elements revealed two contaminants affecting the far-ultraviolet (FUV) performance of the WF/PC. The one contaminant (heavy volatile) is correlated with the electronic and housing temperature, and the contamination is significantly reduced when the electronics are operated below plus 8 degrees to plus 10 degrees C. The other contaminant (light volatile) is controlled by the heat pipe temperature, and the contamination is significantly reduced when the Thermal Electric Cooler (TEC) hot-junction temperature is below minus 40 degrees to minus 50 degrees C. The utility of contamination sensors located behind instruments during system tests was demonstrated