Total hemispherical emittance measured at high temperatures by the calorimetric method

Abstract

A calorimetric vacuum emissometer (CVE) capable of measuring total hemispherical emittance of surfaces at elevated temperatures was designed, built, and tested. Several materials with a wide range of emittances were measured in the CVE between 773 to 923 K. These results were compared to values calculated from spectral emittance curves measured in a room temperature Hohlraum reflectometer and in an open-air elevated temperature emissometer. The results differed by as much as 0.2 for some materials but were in closer agreement for the more highly-emitting, diffuse-reflecting samples. The differences were attributed to temperature, atmospheric, and directional effects, and errors in the Hohlraum and emissometer measurements (plus or minus 5 percent). The probable error of the CVE measurements was typically less than 1 percent