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Measurement of continuous bending deformation for circuit boards by digital holographic interferometry
Authors
付永辉 FU Yong-hui
姜宏振 JIANG Hong-zhen
+5 more
杨德兴 YANG De-xing
王骏 WANG Jun
许增奇 XU Zeng-qi
赵建林 ZHAO Jian-lin
邵兆申 SHAO Zhao-shen
Publication date
1 January 2012
Publisher
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Doi
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Abstract
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info:doi/10.3788%2Fope.2012200...
Last time updated on 19/06/2021