Beling, CD

Chen, XD

Fung, SHY

Gong, M

Ling, FCC

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Title Deep level transient spectroscopy study of particle irradiationinduced defects in n-6H-SiC (Abstract)Author(s) Chen, XD; Gong, M; Fung, SHY; Beling, CD; Ling, FCCCitationThe 2004 March Meeting of the American Physical Society,Montreal, QC., Canada, 22-26 March 2004. In American PhysicalSociety Bulletin, 2004, v. 49, p. 534Issued Date 2004URL http://hdl.handle.net/10722/47042Rights American Physical Society Bulletin. Copyright © AmericanPhysical Society.

Deep level transient spectroscopy study of particle irradiation induced defects in n-6H-SiC (Abstract)

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Deep level transient spectroscopy study of particle irradiation induced defects in n-6H-SiC (Abstract)

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