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On the vectorial calibration of a VSM for measuring thin films
Authors
Leon Abelmann
Thijs Bolhuis
J.C. Lodder
E.O. Samwel
Publication date
30 August 1998
Publisher
Abstract
Abstract is not available.
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University of Twente Research Information
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Last time updated on 12/07/2023
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Last time updated on 14/10/2017