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First-principles study of the impact of hydrogen passivation on the charge state transition levels of the CiOi(Sii)n defect complexes in silicon
Authors
Abdulgaffar Abdurrazaq
W.E. (Walter Ernst) Meyer
Abdulrafiu T. Raji
Publication date
1 November 2020
Publisher
'Springer Science and Business Media LLC'
Doi
Abstract
Please read abstract in the article.The National Research foundation (NRF) of South Africa (Grant specific unique reference number (UID) 98961).https://www.springer.com/journal/126332021-07-16hj2020Physic
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Last time updated on 03/08/2022