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    Transmission electron microscopy study on silicon nitride/stainless steel bonded interfaces

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    3 pages, 3 figures.-- Printed version published Nov 28, 2008.The reaction zone of a diffusion bonded Si3N4/stainlees steel (ss) interface formed at 1100掳C was analyzed by transmission electron microscopy and X-ray diffraction (XRD). Besides the formation of various iron silicides, iron nitride and chromium nitride phases detected by XRD, Cr3Ni5Si2 crystals were identified at the interface by TEM.This work was financially supported by MEC (Spain) under project MAT2006-7118.Peer reviewe
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